Metrological Detection of Multipartite Entanglement from Young Diagrams
Autori: Ren Z.; Li W.; Smerzi A.; Gessner M.
Affiliazione autori: Institute of Theoretical Physics and Department of Physics, State Key Laboratory of Quantum Optics and Quantum Optics Devices, Collaborative Innovation Center of Extreme Optics, Shanxi University, Taiyuan, 030006, China; Laboratoire Kastler Brossel, ENS-University PSL, CNRS, Sorbonne University, Collige de France, 24 Rue Lhomond, Paris, 75005, France; QSTAR, INO-CNR, LENS, Largo Enrico Fermi 2, Firenze, 50125, Italy
Abstract: We characterize metrologically useful multipartite entanglement by representing partitions with Young diagrams. We derive entanglement witnesses that are sensitive to the shape of Young diagrams and show that Dyson?s rank acts as a resource for quantum metrology. Common quantifiers, such as the entanglement depth and k-separability are contained in this approach as the diagram?s width and height. Our methods are experimentally accessible in a wide range of atomic systems, as we illustrate by analyzing published data on the quantum Fisher information and spin-squeezing coefficients.
Giornale/Rivista: PHYSICAL REVIEW LETTERS
Volume: 126 (8) Da Pagina: 080502-1 A: 080502-6
Parole chiavi: metrology; quantum entanglementDOI: 10.1103/PhysRevLett.126.080502