Metrological Detection of Multipartite Entanglement from Young Diagrams
Anno: 2021
Autori: Ren Z.; Li W.; Smerzi A.; Gessner M.
Affiliazione autori: Shanxi Univ, Inst Theoret Phys, Taiyuan 030006, Peoples R China; Shanxi Univ, State Key Lab Quantum Opt & Quantum Opt Devices, Dept Phys, Collaborat Innovat Ctr Extreme Opt, Taiyuan 030006, Peoples R China; Sorbonne Univ, Univ PSL, Coll France, Lab Kastler Brossel,ENS,CNRS, 24 Rue Lhomond, F-75005 Paris, France; INO CNR, QSTAR, Largo Enrico Fermi 2, I-50125 Florence, Italy; LENS, Largo Enrico Fermi 2, I-50125 Florence, Italy.
Abstract: We characterize metrologically useful multipartite entanglement by representing partitions with Young diagrams. We derive entanglement witnesses that are sensitive to the shape of Young diagrams and show that Dyson?s rank acts as a resource for quantum metrology. Common quantifiers, such as the entanglement depth and k-separability are contained in this approach as the diagram?s width and height. Our methods are experimentally accessible in a wide range of atomic systems, as we illustrate by analyzing published data on the quantum Fisher information and spin-squeezing coefficients.
Giornale/Rivista: PHYSICAL REVIEW LETTERS
Volume: 126 (8) Da Pagina: 080502-1 A: 080502-6
Parole chiavi: metrology; quantum entanglementDOI: 10.1103/PhysRevLett.126.080502Citazioni: 42dati da “WEB OF SCIENCE” (of Thomson Reuters) aggiornati al: 2024-12-08Riferimenti tratti da Isi Web of Knowledge: (solo abbonati) Link per visualizzare la scheda su IsiWeb: Clicca quiLink per visualizzare la citazioni su IsiWeb: Clicca qui