Amplitude sensitive experiment of pairing symmetry in d(0)-d(0) submicron Y-Ba-Cu-O bicrystal grain boundary junctions
Authors: Sarnelli E., Adamo M., De Nicola S., Cibella S., Leoni R., Nappi C.
Autors Affiliation: CNR Istituto di Cibernetica \’E Caianiello\’, Via Campi Flegrei 34, I-80078, Pozzuoli, Napoli, Italy; CNR-SPIN, Monte S Angelo, Via Cinthia, I-80126 Napoli, Italy; CNR, Istituto Nazionale di Ottica, Via Campi Flegrei 34, I-80078, Pozzuoli, Napoli, Italy; INFN Sezione di Napoli, Complesso Universitario di Monte S Angelo, Via Cinthia, I-80126 Napoli, Italy; CNR Istituto di Fotonica e Nanotecnologie, I-00156 Roma, Italy
Abstract: We have fabricated and analyzed submicron YBa2Cu3O7-x grain boundary Josephson junctions grown on  tilt SrTiO3 bicrystal substrates. We present an experiment sensitive to the amplitude of the order parameter. To this aim, we have measured electrical properties of  tilt bicrystal YBa2Cu3O7-x grain boundary junctions with nominal widths of 700 nm and 300 nm. Junctions are fabricated so that positive lobes of the d-wave electrodes face one another (d(0)-d(0) junction). We demonstrate that, in such devices, the temperature dependences of the critical current may be accounted for by very high-transparency junction barriers, in which the influence of nodes in the pair potential is an essential element. We based our analysis on a recent theoretical model that, starting from the Bogoliubov-de Gennes equations, takes into account the presence of Andreev bound states in layered superconductors, with Cu-O planes tilted with respect the substrate plane, as is the case of  tilt grain boundary junctions.
Journal/Review: SUPERCONDUCTOR SCIENCE & TECHNOLOGY
Volume: 26 (10) Pages from: 105013 to: 105013
More Information: The authors wish to thank Dr G Gentile for supplying SEM images. The financial contribution of EU NMP.2011.2.2-6 IRONSEA project no. 283141 is gratefully acknowledged.DOI: 10.1088/0953-2048/26/10/105013Citations: 4data from “WEB OF SCIENCE” (of Thomson Reuters) are update at: 2020-08-02References taken from IsiWeb of Knowledge: (subscribers only)Connecting to view paper tab on IsiWeb: Click hereConnecting to view citations from IsiWeb: Click here