Measurement of the thermal expansion coefficients of ferroelectric crystals by a moire interferometer

Year: 2007

Authors: Pignatiello F., De Rosa M., Ferraro P., Grilli S., De Natale P., Arie A., De Nicola S.

Autors Affiliation: CNR – Istituto Nazionale di Ottica Applicata, Sezione di Napoli, Via Campi Flegrei 34, 80078 Pozzuoli (NA), Italy;
LENS, European Laboratory for Non-Linear Spectroscopy, Via Campi Flegrei 34, 80078 Pozzuoli (NA), Italy;
Department of Electrical Engineering Physical Electronics, Faculty of Engineering, Tel Aviv University, 69978 Tel Aviv, Israel;
CNR, Istituto di Cibernetica “E. Caianiello”, Via Campi Flegrei 34, 80078 Pozzuoli (NA), Italy

Abstract: A moire interferometer is used to measure the thermal expansion of two ferroelectric crystals, LiNbO3 and KTiOPO4. The crystal samples are patterned with a chromium reflective grating and used as a diffractive component in a reflective grating interferometer. The thermal expansion of all the three axes of congruent LiNbO3 and of x and y axes of the flux-grown KTiOPO4 were measured from room temperature to 200 degrees C. For this temperature range the thermal expansion coefficient has been modeled by a second-order polynomial and its coefficients have been estimated by accurate analysis of the resulting moire fringe pattern. (C) 2007 Elsevier B.V. All rights reserved.

Journal/Review: OPTICS COMMUNICATIONS (PRINT)

Volume: 277 (1)      Pages from: 14  to: 18

More Information: Funding sponsor: Ministero dell’Istruzione, dell’Università e della Ricerca, MIUR. Israel Science Foundation, ISF, RII3-CT-2003-506350. Israel Science Foundation, ISF, 960/05. Ministero dell’Istruzione, dell’Università e della Ricerca, MIUR. – The authors thank Alexander Tsukernik and Boris Kagan for their assistance. This research was partially funded by the Ministero dell’Istruzione dell’Universitáe della Ricerca (MIUR), Project MIUR No. 77 DD N.1105/2002, Israel Science Foundation, Grant No. 960/05, and by UE contract: RII3-CT-2003-506350.
KeyWords: Ferroelectric crystals; Moire interferometry; Second order polynomials, Diffraction gratings; Ferroelectric devices; Interferometers; Lithium compounds; Polynomials; Thermal expansion, Crystals
DOI: 10.1016/j.optcom.2007.04.045

Citations: 21
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