Scientific Results

Fractal characteristics of far-field diffraction patterns for two-dimensional Thue-Morse quasicrystals

Year: 2011

Authors: Yang M-y., Zhou J., Petti L., De Nicola S., Mormile P.

Autors Affiliation: Institute of Photonics, Faculty of Science, Ningbo University, Ningbo 315211, China;
Istituto di Cibernetica “E. Caianiello” del Consiglio Nazionale delle Ricerche, Via Campi Flegrei 34, Pozzuoli (Na) 80078, Italy;
Istituto Nazionale di Ottica del Consiglio Nazionale delle Ricerche, Via Campi Flegrei 34, Pozzuoli (Na) 80078, Italy

Abstract: We report a numerical method to analyze the fractal characteristics of far-field diffraction patterns for two-dimensional Thue-Morse (2-D TM) structures. The far-field diffraction patterns of the 2-D TM structures can be obtained by the numerical method, and they have a good agreement with the experimental ones. The analysis shows that the fractal characteristics of far-field diffraction patterns for the 2-D TM structures are determined by the inflation rule, which have potential applications in the design of optical diffraction devices.

Journal/Review:

Volume: 7 (5)      Pages from: 346  to: 349

KeyWords: fractal
DOI: 10.1007/s11801-011-1057-0

English