A perspective on multiparameter quantum metrology: From theoretical tools to applications in quantum imaging

Year: 2020

Authors: Albarelli F., Barbieri M., Genoni M. G., Gianani I.

Autors Affiliation: Univ Warsaw, Fac Phys, PL-02093 Warsaw, Poland; Univ Warwick, Dept Phys, Gibbet Hill Rd, Coventry CV4 7AL, W Midlands, England; Univ Roma Tre, Dipartimento Sci, I-00146 Rome, Italy; CNR, Ist Nazl Ottica, I-50125 Florence, Italy;‎ Univ Milan, Quantum Technol Lab, Dipartimento Fis Aldo Pontremoli, I-20133 Milan, Italy; Sapienza Univ Roma, Dipartimento Fis, I-00185 Rome, Italy

Abstract: The interest in a system often resides in the interplay among different parameters governing its evolution. It is thus often required to access many of them at once for a complete description. Assessing how quantum enhancement in such multiparameter estimation can be achieved depends on understanding the many subtleties that come into play: establishing solid foundations is key to delivering future technology for this task. In this article we discuss the state of the art of quantum multiparameter estimation, with a particular emphasis on its theoretical tools, on application to imaging problems, and on the possible avenues towards the next developments. (C) 2020 Elsevier B.V. All rights reserved.


Volume: 384 (12)      Pages from: 126311-1  to: 126311-11

KeyWords: Quantum estimation; Quantum sensing; Quantum imaging; Superresolution imaging
DOI: 10.1016/j.physleta.2020.126311

Citations: 49
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